[Editor's Note] In various industries, including electric vehicles, semiconductor failures can be life-threatening, making reliability essential and lifespan prediction paramount. Therefore, testing under various stress conditions and then conducting physical analysis to determine whether design or process changes are necessary is crucial. This requires a reliable test solution for semiconductor lifespan prediction. NI will present its "High-Power Semiconductor Dynamic Reliability Test Solution" at the " 2025 e4ds Tech Day " on September 9th. Accordingly, we met with NI Director Sung-Woong Yong, who was presenting the presentation, to learn about the dynamic reliability test solution.


■ I am curious about the dynamic reliability testing solution that will be introduced this time, and how it differs from existing methods.

Dynamic reliability test solutions include DGS (Dynamic Gate Stress), DRB (Dynamic Reverse Bias), D. H3TRB (Dynamic high-humidity, high-temperature reverse bias), and D. This refers to equipment that can test HTFB (Dynamic high-temperature forward bias) items.

The biggest difference from existing static test solutions is that testing is performed by applying dynamic voltage to power semiconductors or power modules.

The difference from the static test, which inputs a static voltage, is that the test is conducted under voltage stresses close to those that semiconductors may receive in an actual application environment.

■ Why is predicting the lifespan of WBG semiconductors particularly important? I am also curious about how test results are reflected in actual product design or supply processes.

WBG semiconductors can be used in a variety of industries, but the growth of the electric vehicle market has significantly stimulated research and development.

In automobiles, the reliability and lifespan prediction of semiconductors are more important than anything else, as even minor component defects or malfunctions can lead to a high probability of death.

Automotive semiconductor reliability testing is not conducted in a single method, but rather the semiconductor itself or module type product is tested by reflecting the various stress conditions listed in AQG-324.

However, this does not mean that the product design or process is changed based on the reliability test results obtained here. Rather, design changes or process changes are made after the cause and effect analysis is completed using physical analysis methods on products that have completed reliability tests.

■ I am curious about what requirements are most frequently received from customers and partners, and how NI provides technical support.

Currently in the Power Semiconductor field The questions and requests NI is receiving include, 'What solutions does NI have?', 'Direct questions about AQG-324', and 'Do you have equipment that can perform Power Semiconductor reliability testing?'

NI listens directly and indirectly to the requests and obstacles of customers requiring power semiconductor reliability testing through its German research center, and as a member of AQG-324, we strive to support customers in addressing their challenges through the development of core technologies.

Additionally, NI Korea is training dedicated engineers to provide customer support.

■ What topics will be presented at the 2025 e4ds Tech Day?

The presentation title is “High-Power Semiconductor Dynamic Reliability Test Solution,” and it introduces a dynamic reliability test solution for accurate life prediction of WBG high-power semiconductors.

We will also provide practical information and insights on testing high-power semiconductors made of SiC and GaN materials according to the latest industry standards.

■ A word to readers

NI possesses the best technology and know-how in reliability dynamic testing of power semiconductors, and has been providing solutions to solve the difficulties of many customers around the world for many years. It is the world's leading dynamic test solution provider with the largest market share.

I hope you have the opportunity to experience NI solutions through this Tech Day.

Meanwhile, '_blank">Applications for '2025 e4ds Tech Day' can be made on the official website ( https://www.e4ds.com/conference/techday/ ).