I3C and 100BASE-T1 Analyzers, Why You Need Them
The I3C protocol has been established to overcome the limitations of I2C and SPI communication methods for safe and rapid transmission of large-volume…
2021.04.01 by 이수민 기자
Keysight Launches 'SBE' Integrated Instrumentation to Support Distance Learning
Keysight has launched the 'Smart Bench Essential (SBE),' which consists of a triple-output power supply, arbitrary function generator, digital multime…
2021.03.17 by 명세환 기자
Lapis Unveils Multiband LSI for Broadband Network Construction
Rohm Group Lapis Technology has developed the ML7436N multiband wireless LSI, optimized for building broadband networks required by smart factories an…
2021.01.19 by 강정규 기자
Keysight Unveils Seven-Instrument Integrated EXR Oscilloscope
Keysight has launched the Infiniium EXR-series mixed-signal oscilloscope. The new product offers 4/8 analog channels and maximum bandwidth of 2.5GHz, …
2020.12.23 by 강정규 기자
KLA Unveils Two Systems for High-Speed Measurement of Wafer Defects
KLA announced the 'PWG5 wafer geometry metrology system' and 'SurfScan SP7XP wafer defect inspection system' designed to address advanced memory and l…
2020.12.15 by 이수민 기자
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Tektronix Unveils New Optical Transceiver Test Platform
Tektronix has launched the '8 Series Sampling Oscilloscope' platform as a distributed modular measurement instrument. The 8 Series Sampling Oscillosco…
2020.12.09 by 이수민 기자
Keysight Announces Five New Measurement Software Products That Eliminate Computing Limitations
Engineers tasked with designing and testing electronic equipment face the challenge of overcoming the complexity of data crunching that takes weeks to…
2020.11.30 by 이수민 기자
Keysight Unveils Real-World-Based "5G VDT Toolset"
Keysight has launched a 5G virtual drive test toolset that enables 5G device and chipset manufacturers, as well as mobile operators, to validate end-u…
2020.11.25 by 이수민 기자
How to compensate for and prevent losses caused by test equipment?
Nearly all companies that design and develop electronic products have experienced predictable delays and associated costs due to incorrect configurati…
2020.10.22 by 이수민 기자
Choosing the right wideband synthesizer for your communications and measurement systems
With demands for high bandwidth and fast data rates, requirements for system frequency and modulation speed continue to increase. Low power characteri…
2020.04.17 by 이수민 기자
KLA Launches Two IC Micro-process Measurement Systems
KLA has launched the Archer 750 overlay metrology system and SpectraShape 11k CD and dimensional shape metrology system. The Archer 750 overlay metrol…
2020.02.27 by 이수민 기자