웨비나Part 1: Introduction to "5 Series MSO Scope" for Automotive, Power, and Embedded System Measurements
Part 1: Introduction to "5 Series MSO Scope" for Automotive, Power, and Embedded System Measurements
Part 2: Introduction to VNA and EMI Measurement for Testing Various Cables in IoT and Embedded Systems
-Part 1-
Engineers are seeking optimal measurement solutions while considering the performance and efficiency of the design Device Under Test (DUT), which is the most critical element in hardware system design and development. In particular, as hardware design in automotive, power, and embedded systems becomes increasingly sophisticated, the functional requirements for oscilloscopes among various solutions that must be considered during technology-intensive DUT development are becoming increasingly diverse.
There is demand for multi-channel oscilloscopes in automotive and power measurements, demand for oscilloscopes with 12-bit or higher measurement performance for verification of Vertical resolution strongly required for noise measurement in embedded systems, and additionally, beyond analog signal measurement, demand to simultaneously verify the logic functionality of dozens of digital channels at once. Furthermore, equipment capable of simultaneously handling roles beyond oscilloscope functionality, such as those of a Function Generator, is becoming a desired specification for engineers.
Accordingly, the "5 Series MSO Scope" recently announced by Tektronix is equipped with Linux and Windows 10 and uses a latest 15.6-inch Touch UI. Additionally, it provides up to 8 analog channels and 64 digital channels together, and supports Vertical resolution up to 16-bit. In particular, we will introduce the 5 Series MSO, which concentrates Tektronix's technological capabilities that have traditionally provided strong development and verification solutions, with applications (I2C, SPI, RS-232, CAN, LIN, FlexRay, USB, Ethernet, 10/100BASE-T, AUDIO(I2S/LJ/RJ/TDM)) and jitter (Eye) verification capabilities.
-Part 2-
The Internet of Things is a technology that embeds sensors and communication functions in various objects to connect them to the internet, requiring communication components such as antennas and RF components as major components. In the case of drones, another promising industry, with South Korea assigning drone-exclusive frequencies of 5.03G to 5.09GHz for the first time globally in 2016, the demand for drone development and testing has increased. Additionally, testing of baseband devices and RF embedded in connected cars, wearable devices, and smartphones is also required.
For communication component testing items, filters require accurate passband verification, mixers require RF performance measurement, and antennas require VSWR, return loss, insertion loss, and bandwidth measurement to verify the operating frequency range of the antenna. In particular, "S-parameter" related measurements performed in the frequency domain are the main test targets, with "impedance" measurement additionally required. For this purpose, a "Vector Network Analyzer (VNA)" is utilized. However, this equipment is expensive and difficult to operate. Additionally, it cannot be expanded from 2-port to 4-port, and with sweep points limited to approximately 3,000 to 7,000, its performance is insufficient relative to cost. Furthermore, VNAs are also used in measuring physical characteristics of various types of cables in the several GHz band range. As such, VNA is fundamentally a frequency domain measurement instrument capable of measuring component loss magnitude, but has the limitation of being unable to accurately identify the failure location where actual improvement is required.
In contrast, the "TDR (Time Domain Reflectometry)" function enables measurement in the time domain, making it easy and convenient to identify loss occurrence points, thus complementing VNA's limitations, and many engineers use it as a test item for component defect locations or performance improvement.
Additionally, for antennas and components generating significant EMI signals, "EMI testing" is required. However, conducting this in a formal test lab has been difficult due to the significant time, effort, and expense involved. To address this, Tektronix supports "Pre-EMI" testing that provides high-performance spectrum at a more affordable price.
In this session, we plan to provide in-depth explanation of the various tests enumerated above and measurements using Tektronix's recently released PC-based VNA and spectrum analyzer supporting EMI pre-compliance.
Engineers are seeking optimal measurement solutions while considering the performance and efficiency of the design Device Under Test (DUT), which is the most critical element in hardware system design and development. In particular, as hardware design in automotive, power, and embedded systems becomes increasingly sophisticated, the functional requirements for oscilloscopes among various solutions that must be considered during technology-intensive DUT development are becoming increasingly diverse.
There is demand for multi-channel oscilloscopes in automotive and power measurements, demand for oscilloscopes with 12-bit or higher measurement performance for verification of Vertical resolution strongly required for noise measurement in embedded systems, and additionally, beyond analog signal measurement, demand to simultaneously verify the logic functionality of dozens of digital channels at once. Furthermore, equipment capable of simultaneously handling roles beyond oscilloscope functionality, such as those of a Function Generator, is becoming a desired specification for engineers.
Accordingly, the "5 Series MSO Scope" recently announced by Tektronix is equipped with Linux and Windows 10 and uses a latest 15.6-inch Touch UI. Additionally, it provides up to 8 analog channels and 64 digital channels together, and supports Vertical resolution up to 16-bit. In particular, we will introduce the 5 Series MSO, which concentrates Tektronix's technological capabilities that have traditionally provided strong development and verification solutions, with applications (I2C, SPI, RS-232, CAN, LIN, FlexRay, USB, Ethernet, 10/100BASE-T, AUDIO(I2S/LJ/RJ/TDM)) and jitter (Eye) verification capabilities.
-Part 2-
The Internet of Things is a technology that embeds sensors and communication functions in various objects to connect them to the internet, requiring communication components such as antennas and RF components as major components. In the case of drones, another promising industry, with South Korea assigning drone-exclusive frequencies of 5.03G to 5.09GHz for the first time globally in 2016, the demand for drone development and testing has increased. Additionally, testing of baseband devices and RF embedded in connected cars, wearable devices, and smartphones is also required.
For communication component testing items, filters require accurate passband verification, mixers require RF performance measurement, and antennas require VSWR, return loss, insertion loss, and bandwidth measurement to verify the operating frequency range of the antenna. In particular, "S-parameter" related measurements performed in the frequency domain are the main test targets, with "impedance" measurement additionally required. For this purpose, a "Vector Network Analyzer (VNA)" is utilized. However, this equipment is expensive and difficult to operate. Additionally, it cannot be expanded from 2-port to 4-port, and with sweep points limited to approximately 3,000 to 7,000, its performance is insufficient relative to cost. Furthermore, VNAs are also used in measuring physical characteristics of various types of cables in the several GHz band range. As such, VNA is fundamentally a frequency domain measurement instrument capable of measuring component loss magnitude, but has the limitation of being unable to accurately identify the failure location where actual improvement is required.
In contrast, the "TDR (Time Domain Reflectometry)" function enables measurement in the time domain, making it easy and convenient to identify loss occurrence points, thus complementing VNA's limitations, and many engineers use it as a test item for component defect locations or performance improvement.
Additionally, for antennas and components generating significant EMI signals, "EMI testing" is required. However, conducting this in a formal test lab has been difficult due to the significant time, effort, and expense involved. To address this, Tektronix supports "Pre-EMI" testing that provides high-performance spectrum at a more affordable price.
In this session, we plan to provide in-depth explanation of the various tests enumerated above and measurements using Tektronix's recently released PC-based VNA and spectrum analyzer supporting EMI pre-compliance.

댓글
- 55 Comments
- 신*영 (2024-03-22 오전 9:18:03)
- 좋은 세미나 감사합니다.
- 이*진 (2024-03-22 오전 9:17:53)
- 좋은 세미나 감사합니다.
- 홍*음 (2017-11-02 오후 4:13:21)
- 좋아요
- 홍*음 (2017-11-02 오후 4:12:32)
- 기대 됩니다
- 손*환 (2017-09-01 오전 7:08:59)
- 세미나 기대합니다
- 최*민 (2017-08-31 오전 10:15:59)
- 좋은 세미나 기대합니다.
- 표*건 (2017-08-31 오전 9:43:59)
- 기대합니다.
- 김*주 (2017-08-30 오후 10:36:40)
- 8채널 스코프 제품의 성능 및 기능이 많이 궁금해집니다. 기대합니다.
- 정*균 (2017-08-30 오후 12:16:05)
- 유익한 세미나 기대합니다.
- 류*환 (2017-08-30 오전 11:19:23)
- 여러가지유용한 솔류션과 어플리케이션소개 부탁드립니다.

.png)