SiC Power Semiconductor Dynamic High-Power Reliability Test Solution from Device to Module
SiC Power Semiconductors, Dynamic High-Power Reliability Test Solutions from Devices to Modules
High-performance WBG devices require matching test methodologies.
Along with the rapid growth of the electric vehicle market, SiC and GaN-based wide bandgap (WBG) power semiconductors are establishing themselves as key components
based on their performance in high-efficiency and high-temperature environments.
Now is the time to demonstrate performance and reliability not through simple static testing alone, but through 'dynamic testing' that closely approximates actual operating conditions.
In this webinar, through the latest dynamic high-power test system proposed by NI,
we introduce a new approach for ensuring operation of next-generation power semiconductors and analyzing failure mechanisms.
Webinar Key Topics
🔥 1. World's First! Dynamic HTFB System Introduction
Real-time testing is possible even under high-temperature Forward Bias conditions
First public unveiling of NI's next-generation dynamic test technology
🛠️ 2. Exclusive Introduction of NI Dynamic Test System Lineup
75% market share, chosen by global automotive manufacturers
NI's high-power semiconductor evaluation solution
📐 3. AQG-324 & JEDEC JC70-Based Reliability Assessment Overview
International standards that define lifetime and operation assurance conditions for WBG devices explained with actual test conditions
Recommended For
✔️ Power semiconductor engineers who need practical solutions for SiC and GaN-based WBG device testing
✔️ Developers preparing for reliability evaluation and quality certification of high-power electric vehicle modules
✔️ Quality/test engineers responsible for automotive electrical component design and verification
✔️ Researchers and personnel needing compliance strategies for international test standards (AQG/JEDEC)
Test methodologies must evolve as well.
Performance verification in dynamic environments - confirm practical implementation strategies in this webinar.

- 7 Comments
- 조*진 (2025-06-12 오후 3:00:05)
- 발열 이슈는 없는지 문의 드립니다
- 민*우 (2025-06-12 오전 10:03:21)
- 유익한 세미나 기대합니다.
- 이*진 (2025-06-12 오전 7:55:38)
- 좋은 세미나 기대합니다.
- 강*태 (2025-06-04 오전 10:26:54)
- 기대됩니다
- 박*원 (2025-05-27 오후 1:29:54)
- 좋은강의 부탁 드립니다.
- 강*성 (2025-05-27 오전 10:36:01)
- 유익한 내용 기대합니다
- 최*휴 (2025-05-16 오후 12:48:12)
- 좋은강의 부탁 드립니다.

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