Part 3: Introduction to Measurement Technology for Agile and Intermittent Signals Using Real-Time Spectrum Analysis Technology / Part 4: Device Characterization in Millimeter Wave/Terahertz Frequency Bands

Part 3: Measuring signals that change in short time intervals or occur intermittently is not a straightforward task. The choice of method and tools used when measuring such signals can have a very significant impact on detection results. In this topic, we will examine considerations and analysis techniques for measuring such signals, and we will also compare and explain the performance of traditional Swept-Tuned spectrum analysis techniques with the latest Real-Time spectrum analysis techniques. Part 4: Recently, there has been growing interest in sub-millimeter wave/terahertz applications both domestically and internationally, and related research is also being actively pursued in Korea. In this session, we will introduce examples of millimeter wave/terahertz applications and examples of Agilent measurement solutions using network analyzers.