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Electronic device sizes continue to shrink while signal speeds increase and environmental specifications become more stringent. This direction in the electronics industry creates oscilloscope probing challenges that did not exist previously. In this presentation, we will examine five common probing issues: measuring small signals in the presence of large offsets, signal probing at extreme temperatures, probing in high-density integrated circuits, best practices for Infiniimax probe usage, and methods to eliminate probing effects. We will then introduce how Keysight's differentiated solutions address these challenges.