Standard for Next-Generation Power Semiconductor Reliability

The Standard for Next-Generation Power Semiconductor Reliability

SiC Power Semiconductor Dynamic Testing and the Reality of AQG 324

 

Power semiconductors are now the core of every industry.

From electric vehicles and charging infrastructure to renewable energy and industrial power systems,

wherever high-efficiency and high-reliability power design is required,

next-generation power semiconductors must be applied, particularly SiC (Wide Bandgap) devices.

 

However, as SiC power semiconductors become more widespread,

the reliability verification methods from the era of conventional silicon semiconductors are reaching their limits.

 

• Can actual lifespan be predicted using only static stress testing?

• How can power devices that must operate for decades be validated during the development phase?

• What criteria were used to establish the reliability standards demanded by the automotive industry?

 

In this webinar,

we redefine SiC power semiconductor reliability issues from a 'testing perspective',

examine the limitations of Static Testing and Dynamic Stress-based verification methods,

and explore the meaning and practical application of the AQG 324 guideline that has emerged primarily in the automotive industry as a unified flow.

 

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💡 Webinar Key Topics

 

(1) Limitations of SiC Power Semiconductor Reliability Verification and the Need for Dynamic Testing

 

✔️ Differences in degradation mechanisms between SiC power semiconductors and conventional silicon devices

✔️ Structural differences between Static Testing and Dynamic Testing

✔️ Actual degradation phenomena demonstrated by Power Cycling and Dynamic Gate Stress

✔️ Lifespan prediction approaches based on VGS Drift and RDS(on) changes

✔️ SiC reliability issues that cannot be explained by conventional testing methods

 

(2) Changes in Automotive Power Semiconductor Reliability Standards as Seen Through AQG 324

 

✔️ Power semiconductor reliability requirements demanded by the automotive industry

✔️ Differences between JEDEC standards and the AQG 324 guideline

✔️ The background behind AQG 324's emergence as a "guideline" rather than a "standard"

✔️ Strategy for shortening development time through dynamic testing

✔️ Industry application cases utilizing actual test equipment and systems

 

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👀 Recommended For

 

✔️ Power engineers responsible for electric vehicle, charger, and power converter design

✔️ Developers currently implementing or evaluating SiC power semiconductors in actual products

✔️ Researchers curious about power semiconductor reliability and lifespan prediction criteria

✔️ Practitioners who need to understand AQG 324 and automotive power semiconductor validation requirements

✔️ Engineers considering next-generation testing strategies beyond Static Testing

 

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Reliability issues with next-generation power semiconductors that cannot be explained by existing testing methods have already become reality.

 

Through this webinar, rather than focusing on materials or devices themselves,

see why 'verification methods' and 'testing standards' become competitive advantages through actual case studies.