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| PD1500A, includes dual pulse tester
| Guaranteeing a Safe WBG Semiconductor Test Environment
Modular design enables testing of many power types
As the global electric vehicle (EV) market grows, the demand for ultra-compact, high-power, and high-efficiency electric power systems is increasing.
The renewable energy and EV industries are seeking to adopt Wide-bandgap (WBG) semiconductor technology. However, many power converter designers are hesitant to adopt the new technology due to potential reliability and repeatability risks associated with the characterization of next-generation semiconductors such as IGBTs or GaN.

Keysight Technologies announced on the 31st the 'PD1500A', a dynamic power device analyzer that includes a Double Pulse tester.
PD1500A provides repeatable WBG semiconductor measurement capabilities while ensuring the safety of the measurement hardware and the professionals performing the tests.
Static and dynamic measurements are required for the complete characterization of SiC or GaN devices. Keysight's B1505A and B1506A power device analyzers provide these dynamic measurements, and the addition of the new PD1500A offers the flexibility required to handle a wide range of dynamic measurements.
The PD1500A can test many device types through its modular design and perform various characterization tests at various power levels.
The initial system provides dual-pulse test characterization and parameter extraction for Si and SiC power semiconductors with a maximum rating of 1.2 kV and 200 A.
In the future, a module will be added to the PD1500A to enable testing on devices requiring more current, such as GaN and power modules.
Siegfried Gross, Vice President and General Manager of Keysight’s Automotive and Energy Solutions Group, stated, “The automotive e-mobility ecosystem feels the need to evolve its existing in-house dynamic test systems,” adding, “However, stability may be compromised during this evolution due to unguaranteed performance and characterization.”
"Keysight further stated, 'We are working closely with designers in the energy and EV industries, as well as semiconductor manufacturers, to provide a dynamic power device analyzer platform featuring dual-pulse test measurement capabilities essential for repeatable and secure characterization of dynamic power devices.'"
| Guaranteeing a Safe WBG Semiconductor Test Environment
Modular design enables testing of many power types
As the global electric vehicle (EV) market grows, the demand for ultra-compact, high-power, and high-efficiency electric power systems is increasing.
The renewable energy and EV industries are seeking to adopt Wide-bandgap (WBG) semiconductor technology. However, many power converter designers are hesitant to adopt the new technology due to potential reliability and repeatability risks associated with the characterization of next-generation semiconductors such as IGBTs or GaN.

Keysight PD1500A Dynamic Power Device Analyzer
Keysight Technologies announced on the 31st the 'PD1500A', a dynamic power device analyzer that includes a Double Pulse tester.
PD1500A provides repeatable WBG semiconductor measurement capabilities while ensuring the safety of the measurement hardware and the professionals performing the tests.
Static and dynamic measurements are required for the complete characterization of SiC or GaN devices. Keysight's B1505A and B1506A power device analyzers provide these dynamic measurements, and the addition of the new PD1500A offers the flexibility required to handle a wide range of dynamic measurements.
The PD1500A can test many device types through its modular design and perform various characterization tests at various power levels.
The initial system provides dual-pulse test characterization and parameter extraction for Si and SiC power semiconductors with a maximum rating of 1.2 kV and 200 A.
In the future, a module will be added to the PD1500A to enable testing on devices requiring more current, such as GaN and power modules.
Siegfried Gross, Vice President and General Manager of Keysight’s Automotive and Energy Solutions Group, stated, “The automotive e-mobility ecosystem feels the need to evolve its existing in-house dynamic test systems,” adding, “However, stability may be compromised during this evolution due to unguaranteed performance and characterization.”
"Keysight further stated, 'We are working closely with designers in the energy and EV industries, as well as semiconductor manufacturers, to provide a dynamic power device analyzer platform featuring dual-pulse test measurement capabilities essential for repeatable and secure characterization of dynamic power devices.'"
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