High-resolution vibration measurements with very low noise
Early detection of structural defects with wireless sensor networks

Analog Devices (Korea CEO Jaehoon Yang) announced a new 3-axis MEMS accelerometer.

The newly announced MEMS accelerometer enables high-resolution vibration measurements with very low noise, enabling early detection of structural defects through wireless sensor networks (WSNs).

The low power consumption of the newly released ADXL354 and ADXL355 accelerometers extends battery life, reducing battery replacement times and extending product usage. The accelerometers' low noise performance and low power consumption enable cost-effective use in low-level vibration measurement applications such as Structural Health Monitoring (SHM).

Additionally, the accelerometer's tilt stability provides excellent repeatability even over temperature and time. This characteristic makes it ideal for use in orientation and navigation systems for unmanned aerial vehicles (UAVs) that utilize inertial measurement units (IMUs) and inclinometers. This new accelerometer provides repeatable tilt measurements under all conditions, minimizing tilt errors without additional compensation, even in harsh environments.

This accelerometer guarantees temperature stability and a null offset coefficient of 0.15 mg/C (maximum). Guaranteed stability minimizes the resources and costs required for calibration and testing, thereby increasing throughput for device OEMs. Furthermore, the sealed packaging used in the product helps ensure that the final product maintains repeatability and stability specifications long after it leaves the factory.

This product offers output from ±2g to ±8g full scale range (FSR), selectable digital filtering from 1Hz to 1kHz, low noise density of 25µ/?Hz at current consumption less than 200µA, and low power consumption and BOM cost, making it comparable to other products that are much more expensive.