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NI Korea Unveils Integrated Semiconductor Test Solution at SEMICON Korea 2017
A solution that reduces testing costs, shortens testing time, and improves measurement accuracy.
Suitable for RF and mixed-signal testing of RF/analog-centric semiconductors
National Instruments (NI) announced that it will participate in 'SEMICON KOREA 2017' and showcase integrated semiconductor test solutions and demos.
At this exhibition, NI Korea will unveil its latest solutions that can reduce semiconductor test costs, shorten test times, and ensure measurement accuracy.
The NI Semiconductor Test System (STS) is designed for use in semiconductor mass production environments. It can be used in a smaller workspace than conventional large-scale ATE systems, reducing power consumption and maintenance efforts. Furthermore, its high-performance testing capabilities make it ideal for RF and mixed-signal testing of RF/analog-centric semiconductors, such as RF power amplifiers and power management ICs (PMICs), which require more complex functionality.

The NI WTS (Wireless Test System) can simultaneously test various wireless communication standards for IoT devices, and its PXI-based automated test solution maximizes efficiency. Additionally, demos will showcase NI's LabVIEW graphical system design software, ATE-grade vector solutions applicable to R&D and mass production, VirtualBench all-in-one instrumentation, portable data measurement platforms, and multi-channel open short tests.
“At this event, NI will showcase test automation solutions that can be applied equally to all test processes from R&D to mass production using modular instruments based on LabVIEW and PXI, as well as embedded control/measurement solutions applicable to semiconductor front-end process equipment,” said Kwon Soon-mook, deputy manager of semiconductor test solutions at NI Korea. “We hope that customers will experience NI’s latest semiconductor test equipment, a global leader in the test and measurement industry, and directly confirm and widely utilize NI’s technological prowess,” he added.
Meanwhile, the NI Korea booth (COEX 3rd floor, Hall D, 5604) will host exhibitions and demonstrations, along with product consultations by expert engineers. Visitors to the NI booth will receive a small souvenir, and a prize draw will feature a chance to win a LEGO MINDSTORMS, a LabVIEW-based toy jointly developed with NI.
Suitable for RF and mixed-signal testing of RF/analog-centric semiconductors
National Instruments (NI) announced that it will participate in 'SEMICON KOREA 2017' and showcase integrated semiconductor test solutions and demos.
At this exhibition, NI Korea will unveil its latest solutions that can reduce semiconductor test costs, shorten test times, and ensure measurement accuracy.
The NI Semiconductor Test System (STS) is designed for use in semiconductor mass production environments. It can be used in a smaller workspace than conventional large-scale ATE systems, reducing power consumption and maintenance efforts. Furthermore, its high-performance testing capabilities make it ideal for RF and mixed-signal testing of RF/analog-centric semiconductors, such as RF power amplifiers and power management ICs (PMICs), which require more complex functionality.
The NI WTS (Wireless Test System) can simultaneously test various wireless communication standards for IoT devices, and its PXI-based automated test solution maximizes efficiency. Additionally, demos will showcase NI's LabVIEW graphical system design software, ATE-grade vector solutions applicable to R&D and mass production, VirtualBench all-in-one instrumentation, portable data measurement platforms, and multi-channel open short tests.
“At this event, NI will showcase test automation solutions that can be applied equally to all test processes from R&D to mass production using modular instruments based on LabVIEW and PXI, as well as embedded control/measurement solutions applicable to semiconductor front-end process equipment,” said Kwon Soon-mook, deputy manager of semiconductor test solutions at NI Korea. “We hope that customers will experience NI’s latest semiconductor test equipment, a global leader in the test and measurement industry, and directly confirm and widely utilize NI’s technological prowess,” he added.
Meanwhile, the NI Korea booth (COEX 3rd floor, Hall D, 5604) will host exhibitions and demonstrations, along with product consultations by expert engineers. Visitors to the NI booth will receive a small souvenir, and a prize draw will feature a chance to win a LEGO MINDSTORMS, a LabVIEW-based toy jointly developed with NI.
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