Analysis of Test Approaches Required in the Smart Device Era

National Instruments (NI) released the '2017 Automated Test Outlook' report.

This annual Test and Measurement Report examines key technologies impacting the automated test environment, ranging from reconfigurable test equipment to software-centric test platforms and ecosystems for next-generation device testing.

The 2017 Automated Test Outlook is produced as a special issue, featuring Dr. James Truchard, co-founder and chairman of the board at NI, who looks back on the past 40 years of the test and measurement industry, examines the latest trends, and forecasts the future.



Dr. Truchard stated, “The first era of modern instrumentation was led by radio and vacuum tubes, the second by Hewlett-Packard and transistors, and now the third era is being led by NI and software.” He added, “We define the current trend as ‘software is the instrument.’ NI designs instrumentation systems for test and measurement in a user-customized manner, supporting engineers and scientists to proactively drive innovation for next-generation products. This is significantly different from traditional instruments that were designed based on specific requirements.”

The 2017 Automated Test Outlook Report can be downloaded from www.ni.com/ato/ko/.