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Automotive Testing Expo 2017 Unveils Solutions and Demos on First Day of Exhibition
National Instruments (hereinafter NI) announced that it will participate in the 'Automotive Testing Expo 2017,' which will be held at KINTEX in Ilsan from March 6 to 8, and will showcase smart test solutions and demos for autonomous vehicles.
At this exhibition, NI plans to unveil the latest solutions capable of reducing testing costs and time for autonomous vehicles and ensuring industry-leading measurement accuracy.
NI's platform-based approach features system-wide timing and synchronization capabilities, enabling it to meet various automotive testing requirements for ADAS, V2X, infotainment, powertrain, body, and chassis.

NI’s Hardware-in-the-Loop (HIL) solution enables the pre-testing of entire embedded systems installed in vehicles by establishing a virtual environment, and enhances the efficiency of engine, ADAS, and electric vehicle testing through a flexible, open platform that allows for easy system upgrades. It was stated that the Test Cell control and monitoring solution provides real-time results based on accurate data and supports faster test execution through the configuration of NI software and NI VeriStand test systems.
In addition, the radar solution enables complete simulation verification through NI's proprietary signal generation, processing, and analysis technologies. In addition, NI’s In Vehicle Logger and Near Field Communication (NFC) tests can be verified through demos.
In particular, on the first day of the exhibition, Ho-Min Jeong, General Manager of NI Korea’s Automotive division, will participate in the corporate session presentation. Under the theme of “Connected Car Test Solutions,” he will present case studies of radar testing for autonomous vehicles at Audi (Germany) and infotainment testing at Harman (USA), both utilizing NI’s solutions. Additionally, at the NI exhibition booth, Simone Keller and Lisa Fuerst, Heads of VRTS (Vehicle Radar Test Solution) at Konrad Technologies, who evaluated Audi’s autonomous vehicles, will showcase live demos. Furthermore, Murali Parthasarathy, NI APAC Automotive Business Development Manager, will provide a detailed explanation of NI’s smart test methods and trends.
Meanwhile, at the NI booth (KINTEX Hall 10, 8018), product consultations with professional engineers will be available along with exhibitions and demos. Pre-consultation applications and exhibition information can be found at korea.ni.com/events/tradeshow .
National Instruments (hereinafter NI) announced that it will participate in the 'Automotive Testing Expo 2017,' which will be held at KINTEX in Ilsan from March 6 to 8, and will showcase smart test solutions and demos for autonomous vehicles.
At this exhibition, NI plans to unveil the latest solutions capable of reducing testing costs and time for autonomous vehicles and ensuring industry-leading measurement accuracy.
NI's platform-based approach features system-wide timing and synchronization capabilities, enabling it to meet various automotive testing requirements for ADAS, V2X, infotainment, powertrain, body, and chassis.
NI’s Hardware-in-the-Loop (HIL) solution enables the pre-testing of entire embedded systems installed in vehicles by establishing a virtual environment, and enhances the efficiency of engine, ADAS, and electric vehicle testing through a flexible, open platform that allows for easy system upgrades. It was stated that the Test Cell control and monitoring solution provides real-time results based on accurate data and supports faster test execution through the configuration of NI software and NI VeriStand test systems.
In addition, the radar solution enables complete simulation verification through NI's proprietary signal generation, processing, and analysis technologies. In addition, NI’s In Vehicle Logger and Near Field Communication (NFC) tests can be verified through demos.
In particular, on the first day of the exhibition, Ho-Min Jeong, General Manager of NI Korea’s Automotive division, will participate in the corporate session presentation. Under the theme of “Connected Car Test Solutions,” he will present case studies of radar testing for autonomous vehicles at Audi (Germany) and infotainment testing at Harman (USA), both utilizing NI’s solutions. Additionally, at the NI exhibition booth, Simone Keller and Lisa Fuerst, Heads of VRTS (Vehicle Radar Test Solution) at Konrad Technologies, who evaluated Audi’s autonomous vehicles, will showcase live demos. Furthermore, Murali Parthasarathy, NI APAC Automotive Business Development Manager, will provide a detailed explanation of NI’s smart test methods and trends.
Meanwhile, at the NI booth (KINTEX Hall 10, 8018), product consultations with professional engineers will be available along with exhibitions and demos. Pre-consultation applications and exhibition information can be found at korea.ni.com/events/tradeshow .
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