Latest version of NI-RFmx, 2.2 reduces test time and cost, accelerates time to market

National Instruments announced NI-RFmx 2.2, the latest version of its advanced measurement software for PXI RF test systems. When used with second-generation PXI vector signal transceivers, the software enables testing of 4.5G/5G RF components such as transceivers and amplifiers using carrier aggregation architectures that combine two frequencies or different networks.


When used in conjunction with the 2nd generation VST, up to 32 LTE carriers can be generated and measured simultaneously, each with 20 MHz of bandwidth, and the carrier spacing structure can be specified using software.

Additionally, NI-RFmx has algorithmic improvements that reduce measurement time. When performing modulation quality and spectrum measurements of wireless technologies such as UMTS/HSPA and LTE/LTE-Advanced Pro, EVM measurement times can be reduced by up to 33%.

“Many semiconductor customers have already adopted NI-RFmx measurement software with PXI and LabVIEW to reduce RF measurement test times, lower test costs and shorten time to market,” said Charles Schroeder, vice president of RF marketing at NI. “The well-documented, rich example code and tight integration with PXI hardware like the second-generation VSTs enable customers to quickly and easily implement NI-RFmx into their test systems.”