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NI Next-Generation LabVIEW NXG to be Continuously Improved to Suit 5G Industry

Google 우선 소스Published2017.06.16 13:42
NI Holds Test Technology Forum for Electronics/Semiconductor, Wireless Communication, and 5G Sectors
Actively Supports Customization Through Customer Case Presentations

National Instruments (NI) held the NI Test Technology Forum on June 15 (Thursday) at Yang-jae El Tower and presented solutions to engineering challenges in the electronics/semiconductor, wireless communication, and 5G sectors.

The event commenced with an opening address by Kwon Sun-mook, Deputy Manager of NI's PXI & Modular Instrumentation division, presenting "Smart Device Test and Future Wireless Technology." Deputy Manager Kwon noted that engineers who participated in the previous NI Leadership Forum cited rapid time-to-market, technology convergence and fusion, low R&D costs, and standardization across technologies as challenges, and stated, "Beyond the areas NI directly supports, we are providing languages, communication protocols, and NI LabVIEW to enhance compatibility," introducing related case studies.

NI released LabVIEW in 1986 and over 31 years has focused on customer-tailored customization aligned with changing trends. In May of this year, NI launched LabVIEW NXG, an upgraded version of NI LabVIEW. Deputy Manager Kwon stated, "Currently, NI LabVIEW NXG supports only data acquisition and measurement functions, but we will continue to improve it to suit the 5G industry sector."



The electronics/semiconductor session presented ▲cost-effective All-in-One instrumentation ▲solutions for efficient mixed-signal IC testing ▲PXI-based ATE-class Vector test solutions ▲RFIC test challenges and FEM (Front-End-Module) test technology ▲NI semiconductor mass production test solutions (LNA Wafer Test) and implementation case studies.

The 5G/wireless communication sector presented ▲3GPP, 5G New Radio standards and industry research trends ▲5G communication prototyping ▲ultra-wideband channelizer and multi-carrier aggregation ▲802.11ax: High-Efficiency Wireless LAN Testing ▲NFC & wireless charging certification and technology trends.

The same topic NI Test Technology Forum will be held on June 28 (Wednesday) at the Daejeon Convention Center.
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