NI Demonstrates Pre-5G Waveform Measurement Technology
Published2017.06.30 10:03National Instruments (NI) announced that it demonstrated Pre-5G waveform generation and measurement technology at the 2017 International Microwave Symposium (IMS) held in Honolulu, Hawaii, USA.
The main content of this demonstration is the generation and analysis of signals related to the waveform of the NR (New Radio) physical layer proposed by the Verizon 5G Technology Forum (5GTF) and 3GPP.
This technology demonstration combined pre-5G software for waveform modulation and demodulation with the 1 GHz bandwidth of the PXIe-5840 Gen 2 Vector Signal Transceiver (VST). Key features of the waveform modulation include the ability to support both Discrete Fourier Transform Spread Orthogonal Frequency Division Multiplexing (DFT-S-OFDM) and Orthogonal Frequency Division Multiple Access (OFDMA) with flexible subcarrier spacing, and component carrier configuration capabilities that support 3GPP 5G NR and Verizon 5GTF specifications up to a total bandwidth of 1 GHz.
This demonstration supported measurement results including power, adjacent channel power, and error vector magnitude (EVM) along with modulation types up to 256-QAM. In addition, representative related application areas include RFIC testing, such as RF power amplifiers, front-end modules, and transceivers.
Charles Schroeder, Vice President of Wireless Design and Test at NI, said, “NI has been able to advance PXI test systems to keep pace with the speed of software development by performing tests and measurements through a software-centric approach. Thanks to this approach, engineers can test future 5G products using the VST-based test systems currently used to test LTE-A and LTE-A Pro products.”
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