Expected to provide reduced testing costs, shorter testing times, and improved measurement accuracy.
Characterization test solution for low-power devices such as wearables and IoT

National Instruments (NI) announced that it will participate in 'Semicon Korea 2018' to showcase integrated semiconductor test solutions and demos.

NI Korea plans to introduce solutions that provide semiconductor test cost reduction, time savings, and measurement accuracy. NI's platform-based approach guarantees high performance and efficiency throughout the entire testing process, from characterization to mass production testing, and offers scalable solutions that resolve various challenges.

The Power Management IC (PMIC) test solution introduced at this exhibition provides characterization testing for low-power devices such as mobile devices, wearables, and IoT. This product maximizes efficiency through automated testing based on NI PXI SMUs. In addition, NI’s flagship solution, the Semiconductor Test System (NI STS), is an integrated software and hardware platform used in semiconductor mass production test environments. It supports the construction of flexible test solutions based on over 1,500 modular instruments and shortens development time by utilizing the same PXI platform from development to mass production.



In addition, the PXI Vector Signal Transceiver, a 4.5G/5G test solution, is a product with a 1GHz bandwidth that integrates five types of instrument functions. Equipped with enhanced bandwidth, EVM performance, and FPGAs, it is also suitable for RF FEM (Front End Module) testing supporting 4.5G and 5G. In addition, through demonstrations, visitors can see semiconductor process equipment monitoring solutions that enable predictive maintenance and cost-effective maintenance to maximize equipment uptime, as well as NFC (Near Field Communication) test solutions usable in the development and mass production phases.

Kwon Soon-mook, Deputy General Manager of Semiconductor Test Solutions at NI Korea, stated, “NI is meeting the enhanced requirements of analog, mixed-signal, and RF testing by providing high-performance smart solutions that address issues regarding cost, scalability, design, and equipment.” He added, “Through this event, we hope customers will experience NI’s latest semiconductor test equipment as a global leader in the test and measurement industry, directly verify NI’s technological capabilities, and make extensive use of them.”