All-in-one head configuration including PXI, test management SW, and LabVIEW programming

National Instruments (NI), which participated in 'SEMICON Korea 2018' held from January 31 to February 2, introduced the Semiconductor Test System (STS).

The STS is a production-ready system. The integrated test head connects to the PXI platform, TestStand test management software, and LabVIEW graphical programming. The tester design, built into the head, includes all the key components of a production tester, including a system controller, DC, AC, and RF instrumentation, DUT interfacing, and an equipment hanger/prober docking mechanism.

The STS Series is available in three configurations: T1, T2, and T4, each housing one, two, or four 18-slot PXI chassis, depending on the test system size. All test systems share a common interfacing infrastructure, allowing systems to be scaled up to meet precise pin-count and site-count requirements, or scaled down for characterization.