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Wideband RFIC, suitable for testing models operating in the 3.3-4.2 GHz and 4.4-5.0 GHz bands
New NI solutions help accelerate time to market and reduce manufacturing test costs.
National Instruments (NI) announced a Sub-6 GHz 5G test reference solution that complies with the 3GPP Release 15 5G New Radio (NR) specification.
As the potential for commercial 5G NR implementations below 6 GHz increases, engineers are actively developing sub-6 GHz 5G RF components and devices. NI's newly released sub-6 GHz 5G NR reference solution enables cost-effective, high-performance testing. This solution allows engineers to quickly finalize designs and easily transition from R&D to production test environments.
NI's latest reference test solution is ideal for testing new wideband RFICs, particularly those operating in the 3.3-4.2 GHz and 4.4-5.0 GHz bands. Engineers can test devices operating at 400 MHz continuous signal bandwidth or greater using the PXIe-5840 Vector Signal Transceiver (VST), a 4.5G/5G test solution that supports 1 GHz of instantaneous signal generation and up to 6 GHz of analysis bandwidth. With the NI VST, engineers can expect improved measurement speeds and better EVM performance for 100 MHz NR signals (-50 dB).

A key component of this solution is NI-RFmx NR measurement software, which has evolved alongside the 3GPP specification. The latest version of NI-RFmx NR measurement software supports 5G NR waveforms and measurements that conform to the initial specification for Non-Standalone (NSA) NR in 3GPP Release 15. This specification enables engineers to test both OFDMA and DFT-s-OFDM carrier-aggregated waveforms with flexible subcarrier spacing from 15 kHz to 120 kHz.
“Our new 5G test solution empowers engineers to rapidly bring 5G technologies to market,” said Jason White, director of RF and wireless test at NI. “This product reduces time to market and measurement calibration time by reusing the same instrumentation and measurement science across multiple stages of product development.”
NI adds this 5G test technology to its existing measurement software offerings for 2G, 3G, LTE-Advanced Pro, WiFi 802.11ax, and Bluetooth 5, creating a comprehensive RF/semiconductor test product portfolio. Engineers can also use the NI VST with more than 600 modular PXI products, spanning DC to mmWave, to create comprehensive semiconductor characterization and manufacturing test systems.
New NI solutions help accelerate time to market and reduce manufacturing test costs.
National Instruments (NI) announced a Sub-6 GHz 5G test reference solution that complies with the 3GPP Release 15 5G New Radio (NR) specification.
As the potential for commercial 5G NR implementations below 6 GHz increases, engineers are actively developing sub-6 GHz 5G RF components and devices. NI's newly released sub-6 GHz 5G NR reference solution enables cost-effective, high-performance testing. This solution allows engineers to quickly finalize designs and easily transition from R&D to production test environments.
NI's latest reference test solution is ideal for testing new wideband RFICs, particularly those operating in the 3.3-4.2 GHz and 4.4-5.0 GHz bands. Engineers can test devices operating at 400 MHz continuous signal bandwidth or greater using the PXIe-5840 Vector Signal Transceiver (VST), a 4.5G/5G test solution that supports 1 GHz of instantaneous signal generation and up to 6 GHz of analysis bandwidth. With the NI VST, engineers can expect improved measurement speeds and better EVM performance for 100 MHz NR signals (-50 dB).
A key component of this solution is NI-RFmx NR measurement software, which has evolved alongside the 3GPP specification. The latest version of NI-RFmx NR measurement software supports 5G NR waveforms and measurements that conform to the initial specification for Non-Standalone (NSA) NR in 3GPP Release 15. This specification enables engineers to test both OFDMA and DFT-s-OFDM carrier-aggregated waveforms with flexible subcarrier spacing from 15 kHz to 120 kHz.
“Our new 5G test solution empowers engineers to rapidly bring 5G technologies to market,” said Jason White, director of RF and wireless test at NI. “This product reduces time to market and measurement calibration time by reusing the same instrumentation and measurement science across multiple stages of product development.”
NI adds this 5G test technology to its existing measurement software offerings for 2G, 3G, LTE-Advanced Pro, WiFi 802.11ax, and Bluetooth 5, creating a comprehensive RF/semiconductor test product portfolio. Engineers can also use the NI VST with more than 600 modular PXI products, spanning DC to mmWave, to create comprehensive semiconductor characterization and manufacturing test systems.
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