NI Improves Semiconductor Test System Software to Support Enhanced Operational Efficiency
Published2019.09.30 13:24NI announced new STS software improvements that enhance the programming and debugging environment, test execution speed, parallel test efficiency, and overall equipment efficiency of NI STS (Semiconductor Test System).
As market conditions become more constrained, semiconductor production test engineers seek to accelerate the process of developing, debugging, and deploying new test programs required for production.
STS Software 2019 provides an enhanced offline environment that enables users without tester access to develop test programs. Additional improvements include a simplified driver environment for redundant instrument programming and user-friendly digital scan support.
With the enhanced debugging environment, users can quickly perform interactive measurements in multisite applications and debug automated tests by simply selecting the relevant DUT sites and pins.
Semiconductor operations and manufacturing managers also face the burden of continuously optimizing packaging and test equipment to improve profitability under the same market conditions. STS Software 2019 increases test throughput based on optimized instrumentation drivers that reduce test execution time and enhanced thread management that improves parallel test efficiency.
Additionally, STS reduces software switching time to prepare for cases where tester setup must be changed between lots, thereby increasing utilization rates and improving overall equipment efficiency.
Ritu Favre, Senior Vice President and General Manager of NI's Semiconductor Business Unit, stated: "Semiconductor companies continuously face requirements to shorten time to market and reduce test costs. National Instruments has significantly improved parallel processing, speed, and efficiency while expanding the capabilities of NI STS. The newly enhanced STS Software 2019 provides considerable value because it enables customers to bring products to market faster and at lower costs."
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