October 23, 2012 – Keithley Instruments, Inc. (Country Manager: Haerang Kim), a global manufacturer of advanced electrical test instruments and systems, introduced seven curve tracer solution configurations consisting of instruments, software, and test fixtures for curve trace applications capable of characterizing high-power devices at up to 3,000 V and 100 A. These products are optimized to provide the industry's lowest-cost solutions for characterizing numerous high-power semiconductor devices based on silicon carbide (SiC) and gallium nitride (GaN) technologies. Furthermore, they are optimized to provide the power required for most high-power device design and development applications, and to meet research, reliability, and failure analysis needs, as well as the characterization and testing requirements of numerous personnel, including power device application engineers, power device engineers, and inspectors.

“Many power device developers appreciate the dynamic range and ease of use of existing curve tracers, but they recognize the need for greater accuracy, performance, graphical user interfaces, and flexibility in measurement channel configuration that can be achieved with the latest parametric analyzers,” said Keithley researcher Lee Stauffer.

Unlike solutions that require all instruments to be housed in a chassis, the seven configurations offered by Keithley all stand out for their flexibility, allowing for the economical addition of new measurement channels whenever user requirements arise, without the need to return the system to the factory for new hardware installation. For example, one can start with an entry-level parametric curve tracer and later add the functionality of System SourceMeter® instruments, such as high voltage or high power. By mixing and matching six different system source meter models, the optimal combination of voltage, current, and power can be found to meet the user's specific needs. Furthermore, Keithley's TSP Link® virtual backplane technology makes it easy to integrate an unlimited number of source-measurement channels. In addition, the entire process is automatically and perfectly synchronized with other source meters in the system.

All seven configurations include the latest version of Keithley’s Automated Characterization Suite (ACS) Basic Edition software, support Keithley’s latest SMUs, and enable 500ns trigger synchronization between instruments by making full use of the Series 2600B’s TSP-Link connected trigger models. This tight synchronization capability maximizes the high-speed pulse mode capabilities of the new Model 2651A and Model 2657A high-power system source meters.

The Windows-compatible ACS Basic Edition package provides control and analysis tools well-suited for high-power device characterization, including an integrated parametric test library for MOSFETs, BJTs, triacs, diodes, IGBTs, and other device types. The software's 'trace' mode utilizes on-screen slider controls that closely resemble the power control knobs of traditional analog curve tracers, allowing users to interactively control source voltage and current levels and monitor power device responses in real time. The software's 'parametric' mode offers a "Fill-in-the-blanks" GUI for precise test configuration and a vast set of tools necessary for accurate parameter extraction. All seven bundles include cables and adapters required for system assembly, as well as numerous sample power devices useful for training and demonstrations.