Agilent Announces High-Performance Benchtop Source Measurement Unit

Agilent Korea (President Kim Seung-yeol) announced the B2900A series, the first line of benchtop source measurement units (SMUs) for testing semiconductors, components, and materials.

This series provides the voltage/current range and precision found in expensive semiconductor device analyzers in a single instrument, and boasts the best measurement speed in its class by producing 12,500 readings per second, which is twice as fast as the speed of competing source measurement units.

In addition, by displaying results on a 4.3-inch color LCD screen with single or dual graphs through an intuitive graphic interface along with the industry's first color display, it enables users to perform interactive testing, debugging, and characterization tasks more quickly and accurately.

The B2900A series consists of four models—the 1-channel B2901A and B2911A, and the 2-channel B2902A and B2912A—depending on measurement resolution, minimum timing interval, and support for viewing modes, allowing customers to select the performance suitable for their test requirements within their budget.

Agilent B2900A SMU Series

Agilent Korea stated, "The innovative B2900A series provides a new level of performance and convenience to engineers developing next-generation devices and products," adding, "We will continue to strive to introduce cost-effective products based on our technological leadership."