Multi-generation test equipment that can be extended to future 3rd generation devices through economical upgrades
Verigy Korea (CEO Ji Eun-hwa, Verigy/NASDAQ: VRGY), a global semiconductor test equipment manufacturer, announced the new HSM3G high-speed memory test solution, which further expands the test capabilities of the V93000 HSM platform for mainstream memory ICs DDR3 and subsequent generations. The V93000 HSM3G is characterized by excellent long-term test economics, providing upgrade capabilities for next-generation device applications and enabling cost-effective testing of up to 3rd generation DDR memory with data transfer rates of up to 6.8Gbps.
Hans-Juergen Wagner, Vice President of SOC Test Solutions at Verige, stated, “Memory manufacturers are seeking cost-effective ATE solutions that can meet productivity and functionality requirements while providing long equipment lifespans and investment protection beyond a single device generation. Verige’s scalable V93000 HSM test platform delivers a high return on investment for devices spanning at least three generations—from DDR3 and DDR4 to next-generation DRAM memory—by achieving unprecedented equipment lifespans. Such test economics are hard to find anywhere else in the industry.”
The V93000 HSM3G is capable of continued use in terms of speed and functionality and demonstrates the most complete performance in the high-speed memory test market. In addition, it enables testing of the latest DDR4 memory technology functions through the At-speed APG (algorithmic pattern generator) per-pin, which supports data bus inversion (DBI) and cyclic redundancy check (CRC) data generation, thereby ensuring high test quality and yield.