LeCroy's General Manager Oh Chang-hoon introduced SPARQ, LeCroy's product for S-parameter measurement, through an interview with e4ds.

SparQ, short for S parameter Quick, which means it can measure S-parameters very quickly, provides bandwidth up to 40 GHz. The most significant feature is that typical S-parameters are measured using vector network analyzers, which require calibration every time. Since incorrect calibration can affect the overall measurement results, it must always be performed carefully, and it is said that it can take anywhere from 10 minutes to 30 minutes, depending on the frequency.

However, it was stated that this SPARQ has an internally built-in calibration standard, allowing it to perform calibration quickly and accurately internally. Therefore, overall, it was claimed that it can measure S-parameter values the fastest in the industry. Furthermore, it was stated that this SPARQ integrates with SI Studio provided by LeCroy to predict how signal quality will change when a specific signal passes through the measured values.

In addition, regarding the use of this SPARQ without a display by connecting it to a PC with an SI studio, the price has been lowered. Also, unlike in the past when vector network analyzers were quite large and required engineers to move to where the instrument was located to use it, this SPARQ is considerably small, so engineers can easily move the instrument anywhere.

Furthermore, it was stated that while calculations during processing are performed internally on the equipment, the interface display utilizes an external PC; therefore, connecting the display to a laptop, as with SPARQ, allows for immediate updates to relevant information and enables the use of high-spec content, which can be considered an advantage. It was also mentioned that SI Studio upgrades can be easily applied.

LeCroy also announced that at an online seminar hosted by Tech World’s Electronic Components on October 25th of this month, they will share know-how regarding the definition of S-parameters used to determine signal transmission losses, methods for measuring and interpreting S-parameters in interconnect systems, and how to apply and analyze the measured results using signal integration tools. Further details can be found on the M-Channel section of the monthly magazine Electronic Components website. M-Channel Link: http://www.epnc.co.kr/mchannel