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NI Unveils Latest Solutions for 5G, Wireless Communication, and Future Vehicle Testing at Technology Forum

Google 우선 소스Published2016.04.21 17:47
'NI Test Technology Forum 2016' to be held in Daejeon and Seoul on May 3–4

National Instruments (ni.com/korea, hereinafter NI) announced that it will hold the 'NI Test Technology Forum 2016' on May 3 at the Intercity Hotel in Daejeon and on May 4 at the El Tower in Yangjae, Seoul.

This year's Test Technology Forum is hosted by National Instruments, a leader in the test industry, and sponsored by the 5G Forum, a collaborative organization involving industry, academia, research, and government preparing for 5th generation mobile communication (5G). Presented across three tracks—Test, IoT & Wireless & 5G, and Future Automobiles—this event serves as a platform to explore the latest technology trends and applications through various presentations, as well as demonstrations and solutions from partner companies, via sessions and exhibitions.

The IoT & Wireless & 5G track introduces domestic and international 5G technology development trends, platforms that meet the requirements of the IoT and RF semiconductor test market, and demonstrates methods to test 80% of IoT device functions, including batteries, sensors, and wireless communication. In particular, Nokia’s mmWave platform, which demonstrated real-time millimeter wave communication at 14.5 Gbps at MWC 2016, will be unveiled for the first time in Korea at this event.

At the Future Vehicles track, application examples of vehicle composite video data for the development of ADAS and autonomous vehicles, and an infotainment test solution integrating six types of vehicle signals will be presented. In addition, you can also check the component testing techniques for 48V mild hybrids that will be applied to all future vehicles.

Han Jeong-gyu, Team Leader of Strategic Marketing at NI Korea, stated, “We plan to showcase application cases of NI smart test systems in various industries such as IoT, 5G, Wireless, and Automotive, based on the techniques and know-how that test engineers need to know,” and added, “Through this event, you can find out everything from development methods required by technological advancements to considerations regarding operations.”

In addition, you can experience how to use PXI-based modular instruments and test management programs through hands-on training.

The free test forum features product consultations and demos by professional application engineers, and also includes an event where attendees can win Dr. Dre headphones, a drone helicam, a smart band Fitbit, and more through a raffle.

You can register to participate in the event on the online page (http://bit.ly/testforum2016) or contact us by phone at 02-3451-3400 or by email (eventkorea@ni.com).
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