Early Detection of Structural Defects Through Wireless Sensor Networks

Analog Devices (Korea Representative Director Yang Jae-hoon) has announced a new 3-axis MEMS accelerometer.

With the newly announced MEMS accelerometer, high-resolution vibration measurement with very low noise is possible, enabling early detection of structural defects through wireless sensor networks (WSN).

The newly launched ADXL354 and ADXL355 accelerometers feature low power consumption, extending battery life and reducing battery replacement intervals while increasing product operating time. Thanks to the low noise performance and low power consumption of the ADXL354 and ADXL355 accelerometers, low-level vibration measurement applications such as Structural Health Monitoring (SHM) systems can now be used cost-effectively.

Additionally, the ADXL354 and ADXL355 accelerometers provide excellent repeatability with respect to inclination stability, maintaining superior performance even as temperature and time change. These characteristics make them suitable for orientation and navigation systems in unmanned aerial vehicles utilizing Inertial Measurement Units (IMU) and inclinometers. These new accelerometers deliver repeatable tilt measurement results under any conditions, minimizing tilt errors without additional calibration even in harsh environments.

The ADXL354 and ADXL355 accelerometers guarantee temperature stability with a null offset coefficient of 0.15mg/°C (maximum). When stability is assured, resources and costs required for calibration and inspection can be minimized, increasing device OEM-related throughput. Furthermore, the hermetically sealed package used in the product helps maintain repeatability and safety specifications long after final products are shipped from the factory.

The ADXL354 and ADXL355 accelerometers offer ±2g to ±8g full scale range (FSR) output, selectable digital filters between 1Hz and 1kHz, and low noise density performance of 25µg/√Hz at current consumption below 200µA, with reduced power consumption and BOM costs that are competitive with much more expensive alternatives.