Announcement of 8-Megapixel IT-EMCCD Device for New Applications in Medical, Scientific, and Security Imaging

ON Semiconductor strengthens its position in the low-light imaging solutions market for industrial applications by introducing new products based on Interline Transfer Electron Multiplying Charge Coupled Device (IT-EMCCD) technology.

The newly released 8-megapixel KAE 08151 image sensor is the second device from ON Semiconductor to use IT-EMCCD technology for less than one electronic noise and imaging versatility, following the existing 1080p pixel KAE 02150 image sensor.

The KAE-08151, with a 22-millimeter diagonal (4/3 optical format) structure consistent with the imaging trends of professional microscopes, targets high-resolution microscopy and scientific imaging applications that must cover all lighting environments, from fine light to bright light imaging. Both devices in this product family adopt a packaging method with a thermoelectric cooler directly embedded. This built-in cooler simplifies the development of a cooled camera that can optimize the performance of the components.

“The performance and design flexibility provided by IT-EMCCD technology have enabled imaging in industrial imaging applications even under low-light conditions,” said Herb Erhardt, Vice President and General Manager of Industrial Solutions, On Semiconductor’s Image Sensor Group.

He also added, “The product we have launched this time features a new resolution as standard while simplifying integration for camera manufacturers. As a result, end users will be able to utilize the product in more applications by taking advantage of this unique technology.”

IT-EMCCD devices combine two existing imaging technologies into a special output structure to enable a new class of low-noise, high-dynamic-range imaging. While IT-CCDs ensure excellent image quality and uniformity by utilizing high-efficiency electronic shutters, they are not always ideal for ultra-low-light imaging due to the overall noise floor of the output.

While EMCCD image sensors have historically been able to achieve low-noise imaging, they were limited to low resolution and restricted dynamic range. However, the combination of these technologies has enabled EMCCD to, for the first time, a low-noise architecture extending to multi-megapixel image sensors. The innovative output design enables standard CCD (low amplification) and EMCCD (high amplification) outputs to be used for single image capture that detects scenes ranging from sunlight to starlight in a single image.

The KAE-08151 is being sampled in monochrome and Bayer color arrays in CPGA-155 packages, and samples integrated with TEC will be available starting in the first quarter of 2017. The already commercialized KAE-02150 is available for sampling in CPGA-143 packages integrated with TEC.

All package options are RoHA compliant and both devices will be exhibited at the ON Semiconductor booth (1C32) at the 2016 VISION exhibition in Stuttgart, Germany, from November 8 to 10.