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Keysight launches high-speed SMU for faster RF power amplifier testing

Google 우선 소스Published2016.09.22 17:15
New functionality added to Keysight PXIe portfolio

Keysight (CEO Deok-kwon Yoon) has announced the M9111A, the industry's first PXI Express source/measurement unit.

This product is designed for design verification and production testing of next-generation power amplifiers and the latest FEM (Front-End Module) that support mobile and wireless connectivity formats.

The M9111A can rapidly change voltage and reliably and accurately measure micro-level low currents in less than 1ms. The PXIe SMU demonstrates 20 times faster speed despite being more compact than Keysight's existing benchtop SMU.

Giampaolo Tradioli, Senior Director of Chipset Mobile Test at Keysight, stated, "In automated power amplifier test environments, test speed is critically important. The M9111A is a welcome new addition to the PXI family to address this challenge. The combination of stable performance maintaining capacitance up to 150 µF maximum, high-speed output, and glitch-free operation makes this an ideal product for power amplifier testing in handsets and mobile phones."

The M9111A's industry-leading transient performance easily addresses the challenge of power amplifiers rapidly drawing current pulses. It also significantly reduces voltage sag from pulsed loads and quickly recovers to the programmed voltage.

The M9111A is part of Keysight's RF power amplifier and FEM (Front-End Module) reference solution, which enables rapid and superior characterization analysis of next-generation power amplifier modules such as power amplifier devices, including S-parameter, demodulation, power, adjacent channel power, and harmonic distortion measurements.
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