Nano-Optical Interference Filter Technology Mounted on CMOS Chip Delivers Precision and Stability

ams has announced the launch of a cost-effective multispectral sensor-on-chip solution.

The ultra-low-power AS7262 visible range sensor and AS7263 NIR sensor, offered in a compact 4.5 x 4.4mm form factor in LGA package, each provide 6 calibrated spectral channels. Key solution areas include material and product authentication, product quality and integrity, as well as substance content analysis in the NIR (near-infrared) and visible light spectrums.

This multispectral sensor utilizes a new manufacturing technology that directly mounts nano-optical interference filters onto a CMOS silicon chip. The interference filter technology used in the sensor exhibits excellent precision and demonstrates stable characteristics against temporal and temperature variations. Additionally, it is smaller in size and more cost-effective compared to components commonly used in recent spectral analysis equipment.


▲ AS7262 Block Diagram

The AS7262, a 6-channel visible light sensor with integrated intelligence functions, provides calibrated digital output through I2C or UART interface. This product measures light intensity at 6 wavelengths (450nm, 500nm, 550nm, 570nm, 600nm and 650nm) in the visible light spectrum. The AS7263 operates in the NIR spectrum, detecting infrared signals at 610nm, 680nm, 730nm, 760nm, 810nm, and 860nm.

Both devices include LED driving circuits and electronic shutters. The multispectral sensor enables measurement equipment manufacturers to leverage these differentiated advantages to develop new product forms.

Jean Francois Durix, Marketing Director for Emerging Sensor Systems at ams, stated: "Through our new spectral sensing solution, which significantly reduces not only size but also the cost of spectral analysis, capabilities that were previously only possible in laboratory settings can now be realized in actual sample products across a wide range of applications, from food safety and product authentication to routine testing."