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Anritsu Announces Upgrade Solution for Signal Quality Analyzers

Google 우선 소스Published2017.01.31 18:21
High-quality signal generation and high input sensitivity measurement
Evaluation of optical modulator reproducibility without external driver amplifier


Anritsu Corporation has announced two upgrades that strengthen the 32 Gbaud PAM4 BER test solutions for its Signal Quality Analyzer MP1800A series.

The newly developed G0375A 32 Gbaud Power PAM4 converter and G0376A 32 Gbaud PAM4 decoder with continuous time linear equalizer (CTLE) support PAM4 *1 input tests and BER *2 measurements defined in the next-generation 200GbE/400GbE *3 and CEI-56G *4 standards.

To evaluate a PAM4 optical communication module, a high amplitude test signal is required to directly drive the optical modulator that performs electro-optical conversion, and to evaluate an EA modulator *6, a signal source capable of independently adjusting the 3Eye amplitudes of the PAM4 signal is required.



Meanwhile, the BER of the 4-level PAM4 signal is measured in the same manner as the NRZ method by splitting it into two binary signals in the PAM4 decoder. Additionally, to verify the correlation with the simulation results, equalizer circuits such as CTLE and BER measurements of signals compensated for transmission line loss must be used.

The MP1800A is a plug-in module type bit error rate tester with built-in 32G multi-channel PPG and ED modules that ensure multi-channel, high-quality signal generation and high input sensitivity measurements.

Combining the G0375A with the 28G/32Gbit/s PPG MU183020A converts 32 Gbit/s NRZ signals to PAM4 signals, outputting high amplitude signals of 4.4 Vp-p (differential, max).

Additionally, the 3ch PPG synchronization function, which allows independent control of the PAM4 signal 3Eye amplitude, enables reproducible evaluation of optical modulators without the use of an external driver amplifier. Furthermore, the G0376A can measure PAM4 decoded binary signals using the 28G/32Gbit/s high-sensitivity ED MU183040B, and when combined with the CTLE function, supports high-efficiency, input sensitivity performance testing.
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