November 17, 2011 – Keithley Instruments (Country Manager: Seok-Yong Yang), a world-leading manufacturer of advanced electrical test instruments and systems, announced an upgraded version of its highly popular industry-leading semiconductor test software, KTE (Keithley Test Environment). KTE Version 5.3 is designed to work with the S530 Parametric Test System, currently the fastest and most cost-effective process control and monitoring solution available. For more information on KTE V5.3, please visit http://www.keithley.com/data?asset=55833 .

KTE is a powerful test development and execution software platform that has been used in hundreds of semiconductor fabs worldwide through Keithley's existing parametric test systems. With this same industry-proven software platform now applied to the Keithley S530 test system, flexible test plan development and high-speed test execution are possible even in the most demanding production environments. Existing measurement routines can be easily ported to the S530, and the same test plans can be shared between existing testers and the new S530 system, allowing users of existing Keithley S400 and S600 series parametric testers, in particular, to benefit from KTE version 5.3 on the S530.

By expanding the KTE test development and execution environment with the S530, you can simultaneously enjoy Keithley’s 30 years of field experience in parametric test code development and the fastest, most advanced system hardware available on the market. The S530 instrument provides a fast and wide measurement range required by parametric test applications such as process control monitoring.

Keithley is committed to supporting its parametric test customers by providing new test systems that are highly compatible with existing systems. This effort to maintain software compatibility ensures a smooth transition when new, fast testers are added to the test floor and protects the investment in fab test software. This commitment to ensuring system software continuity means that new Keithley parametric test customers can be assured that their test systems are based on industry-proven software.

Customers already using existing versions of KTE can quickly and easily integrate the S530 into their existing test floors using KTE V5.3:

The same test methods and plans can be used across all Keithley automated parametric test systems, which not only shortens the learning curve for test engineers and users working with multiple systems but also provides a smooth transition path that protects fab test development investment costs when adding or replacing new high-speed systems on the test floor.
• Users can continue working with familiar libraries long developed for existing Keithley systems after recompiling and rebuilding them for the S530.
• KTE V5.3 simplifies the generation of new User Access Point (UAP) source code for conditional test sequencing and the customization of S530 system operation flows. The UAP source code developed for existing Keithley systems can be applied to the S530 with minimal modifications.
• KTE tools operate identically across all Keithley parametric test platforms.

The KTE for the S530 is designed to run on Linux operating systems on standard industrial PCs for long-term stability and easy management. The software is optimized for the speed and extended stability required in high-volume test environments. Running on KTE V5.3, the S530 system can perform all DC-IV and CV measurements necessary for process control monitoring, process stability monitoring, and device characterization. This system is optimized for use in production parametric test environments where accommodating a wide range of product combinations is required, or where broad application flexibility and rapid test plan development are critical.

Additional information
Additional information on KTE version 5.3 for Model S530 is available at http://www.keithley.com/data?asset=55833 . Documentation on S530 system options can be downloaded at http://www.keithley.com/data?asset=55774 .