CyberOptics Introduces 3D Automated Optical Inspection System Equipped with Multi-Reflection Suppression Sensors
Published2017.08.04 15:43CyberOptics® Corporation, a global leader in developing and manufacturing ultra-precision 3D sensor technology solutions, will showcase the new SQ3000-DD 3D Automated Optical Inspection (AOI) system equipped with two Multi-Reflection Suppression (MRS) sensors at booth 1J45 during the 'NEPCON South China' exhibition held from August 29 to 31 at the Shenzhen Convention & Exhibition Center.
The new SQ3000-DD 3D AOI maximizes flexibility to meet various PCB width requirements, while providing the capability to inspect large volumes of assembled products and the convenience of simultaneously inspecting different assembly products and board sizes in different lanes. Furthermore, two lanes can be converted into a single lane mode for inspecting large boards.
The SQ3000-DD provides inspection flexibility for PCBs and also offers the flexibility to select two identical or different MRS sensors, which both finely identify and eliminate various reflected light caused by light-emitting components and solder joints. This new ultra-high-definition MRS sensor option delivers significantly more precise resolution than standard specifications, demonstrating superior inspection performance, making it suitable for 0201 metric and ultra-miniature electronics applications where very high levels of accuracy and inspection reliability are critical. The unique structure of two MRS sensor options simultaneously captures multiple images and transmits them in parallel, while mixing these images with a highly sophisticated 3D fusing algorithm to provide very fine image quality.
Subodh Kulkarni, President and CEO of CyberOptics, stated, "We have expanded the MRS-implemented SQ3000 3D AOI platform to provide a dual-lane, dual-sensor solution," adding, "This flexibility provides customers with unprecedented speed, accuracy, and ease of use, while enabling higher productivity through high-volume processing."
Additionally, on the display, the QX250i simultaneous dual-sided AOI system enables fast and flexible high-performance inspection for all applications and is suitable for pre-reflow soldering and selective solder inspection. The enhanced brightness upper and lower high-definition Strobed Inspection Modules (SIM) provide a single platform for inspection, eliminate the need for re-inspection processes, shorten production lines, and increase productivity by approximately 50%.
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