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[SEMICON Korea 2018] Tektronix, Easily Analyze Semiconductor Device Defects with One Equipment

Google 우선 소스Published2018.02.06 11:00

A product focused on usability with an intuitive UI

Tektronix, which participated in 'SEMICON Korea 2018' held from January 31 to February 2, introduced the 4200A-SCS parameter analyzer.

The 4200A-SCS parameter analyzer is an integrated modular parameter analyzer for analyzing the electrical characteristics of materials, semiconductor devices, and processes. It is an equipment focused on usability with a visual UI and convenient test sequences, and has the advantage of performing AC measurement movements without errors. Equipped with a high-definition wide screen display, you can intuitively check and operate the test results.

IV tests, CV tests, and pulse tests that were previously performed with SMU (Source Meter Unit) are now possible. Measurements can be made without moving the prober needle or moving cable outside the equipment, and measurements can be made without any separate equipment other than the probe and main body.

Support electrical characterization of materials, semiconductor devices, and processes with a fully integrated modular parameter analyzer. Consisting of a source measure unit for IV characterization, a capacitance-voltage module for AC impedance measurements, and an ultra-fast pulse measure unit capable of pulse IV, waveform capture, and transient IV measurements, the 4200A-SCS provides researchers or engineers with the key parameters they need for materials research, semiconductor device design, development, or production.

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