Single Instrument from RF Components to Smartphones!

National Instruments Korea invites engineers responsible for the development and testing of RF components and mobile devices to introduce the PXI platform optimized for RF testing and to provide ideas for RF automated testing utilizing this platform. Test procedures for mobile devices as well as general components are becoming increasingly complex, and the associated time and costs are rising accordingly. The NI PXI platform unifies multiple types of measurement instruments into an integrated platform, consolidating the test environment while also enabling tight coordination between equipment to dramatically reduce total test time and costs. Don't miss this web seminar where various actual test demonstrations will be conducted!