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# Optimization of WBG Semiconductor Switching Performance through Double Pulse Test (DPT)
Tektronix Double Pulse Test (DPT) Webinar for Latest WBG Power Semiconductor Measurement
**Faster, More Precise!**
Essential Solution for SiC & GaN High-Speed Switching Device Testing**
As adoption of wide bandgap (WBG) semiconductors SiC and GaN increases,
higher voltage, faster switching, and more precise measurement have become essential requirements.
This webinar introduces how to address key challenges in switching performance measurement
using the Tektronix oscilloscope-based DPT solution.
📌 Webinar Key Topics
⚙️ Differentiation Points of Tektronix DPT Solution
✅ State-of-the-Art Oscilloscope & Probe Configuration
Recommended for These Professionals
✔️ Si, SiC, GaN MOSFET and IGBT test engineers
✔️ Those wishing to improve system efficiency through accurate switching loss evaluation
✔️ Those requiring measurement precision and stability assurance in high-speed switching environments
Achieve both precise measurement and efficient design
with the latest WBG semiconductor testing using Tektronix DPT solution!
**Faster, More Precise!**
Essential Solution for SiC & GaN High-Speed Switching Device Testing**
As adoption of wide bandgap (WBG) semiconductors SiC and GaN increases,
higher voltage, faster switching, and more precise measurement have become essential requirements.
This webinar introduces how to address key challenges in switching performance measurement
using the Tektronix oscilloscope-based DPT solution.
- WBG Power Semiconductor Testing Trends & Key Challenges
- Measurement difficulty due to high-speed switching characteristic changes in SiC & GaN
- Double Pulse Test (DPT) Fundamentals and Necessity
- Core testing for switching loss, EMI, and efficiency evaluation
- Measurement Techniques for Common Mode Noise Minimization
- Noise elimination methods for precise measurement
- Automated Switching Loss Analysis Based on JEDEC/IEC Standards
- Implementation of high-precision and repeatable test environment
- Reliable Current and Voltage Measurement in High-Speed Switching Environment
- Signal distortion minimization with latest probe technology
- Optimization of Si, SiC, GaN MOSFET and IGBT Testing through Tektronix DPT Solution
- Provision of comprehensive test solution applicable to various power devices
✅ State-of-the-Art Oscilloscope & Probe Configuration
- Precise measurement without signal distortion even in hundreds of MHz to GHz bandwidth
- 100dB+ common mode noise rejection with IsoVu isolated differential probe
- Automatic switching loss measurement based on JEDEC/IEC standards
- Maximized test repetition and analysis efficiency through software integration
- AFG31000 arbitrary waveform generator built-in software
Intuitive pulse width and timing setup → DPT optimization
- Remote oscilloscope control possible through network integration
✔️ Si, SiC, GaN MOSFET and IGBT test engineers
✔️ Those wishing to improve system efficiency through accurate switching loss evaluation
✔️ Those requiring measurement precision and stability assurance in high-speed switching environments
with the latest WBG semiconductor testing using Tektronix DPT solution!
댓글
- 19 Comments
- 정*균 (2025-03-27 오후 4:33:11)
- 수고많으셨어요
- 김*희 (2025-03-27 오전 11:12:25)
- 좋은 정보 감사합니다.
- 오*철 (2025-03-27 오전 11:10:12)
- 수고하셨습니다.
- 김*혁 (2025-03-27 오전 10:16:07)
- 좋은 강의 부탁 드립니다.
- 김*인 (2025-03-27 오전 10:08:25)
- 기대됩니다
- 김*영 (2025-03-27 오전 10:08:10)
- WBG Double pulse test 강의 기대되네요. 좋은 강의 부탁드립니다.
- 김*훈 (2025-03-27 오전 9:57:56)
- 전력변환기술 측정기술에 대한 학습 기대 합니다.
- 신*영 (2025-03-27 오전 9:32:55)
- 좋은 정보 기대합니다.
- 이*진 (2025-03-27 오전 9:31:40)
- 좋은 세미나 기대합니다.
- 민*우 (2025-03-27 오전 9:31:18)
- 좋은강의 부탁 드립니다.