Focused on personnel with extensive technical experience, including CEO Kim Hyeong-cheol
Main focus is on XSCAN for semiconductor, PCB, etc. inspection equipment and FSCAN for food inspection equipment

XAVIS is a leading company in industrial X-ray equipment.

The company name 'XAVIS' is also derived from 'X-ray Automatic Vision Inspection System'. The company said that it was established by development personnel with many years of experience in developing X-ray, machine vision, and factory automation (FA) equipment.

The purpose is to provide effects such as quality improvement, quality stability, and labor cost reduction by automating the inspection and assembly process. The business areas are largely divided into two areas: Xscan inspection area (inspection system other than electronic components) and Fscan inspection area (food foreign matter inspection system).

In addition, it supports the development of vision systems and S/W for factory automation (FA) equipment, as well as the development of system operation S/W.

▲XSCAN-A100 equipment for inspecting PCBs, semiconductor components, secondary batteries, etc.

Xscan inspection areas include semiconductors, SMT (Surface Mount Technology), PCB (Printed Circuit Board), automotive parts, batteries, etc., while Fscan inspection areas include bakery, meat processing, nuts, coffee, grain bulk, bottle can lines, pharmaceutical packaging inspection, and quantity inspection.

XSCAN is a semiconductor and industrial component inspection equipment. It inspects the inside of parts that cannot be seen with the naked eye, such as over-, under-, and under-sold parts that occur during the semiconductor and SMT manufacturing process. The company supplied ultra-precision semiconductor in-line inspection equipment to Samsung Electronics' semiconductor line, and inspects a variety of products, including die-cast products, industrial precision parts, automobiles, and defense products.

Additionally, this inspection equipment provides internal inspection, pinhole, void, crack, foreign matter inspection, and specialized measurement functions, and also supports automatic inspection of defective and good products.

FSCAN, a food foreign matter inspection equipment, inspects metals and non-metals in food that may occur during the food production process and forms an automatic inspection system before or after packaging in the food and pharmaceutical fields. It inspects foreign substances (lead, iron, copper, copper, glass, stones, bones, etc.) that are difficult to see with the naked eye and, in particular, can apply automatic settings through smart learning, a technology that is patented overseas. This product, which is leading the automatic inspection function for defective and good products, is recording the No. 1 domestic market share.

Average annual growth rate maintained at 22.06% for 13 years

Jarvis, which has maintained positive growth every year since its establishment in 2002, has an average annual growth rate of 22.06% for 13 years until 2015, and in particular, its average annual growth rate for the 9 years from 2007 to 2015 reached 16.5%.

The company's CEO, Kim Hyeong-cheol, is a former head of the Samsung Electronics Intelligent Systems Research Institute (where he worked for 14 years). He participated in the research and development and commercialization of X-RAY inspection equipment at the Samsung Electronics Automation Research Institute, and has experience participating in the research and development of laser 3D measurement systems at the University of Minnesota in the United States (as a visiting researcher). CEO Kim expressed his ambition to lead the global industrial X-ray market based on his 14 years of experience in automation system design, 7 years of experience in image processing, and 5 years of experience in X-ray application technology for non-destructive testing.


Company Overview
Company name: XAVIS
Homepage: http://www.xavis.co.kr/
Representative: Kim Hyung-cheol
Founded: April 2002
Products: Industrial X-ray inspection equipment (food, semiconductor, etc.)