Integrated Modular Keithley 4200A-SCS, Easing the Complexity of Semiconductor Characterization

Tektronix has introduced a fully integrated, customizable Keithley 4200A-SCS parameter analyzer.

The Keithley 4200A-SCS parameter analyzer helps new users or customers looking for temporary use understand semiconductor devices, materials, and processes by providing clear and precise results with simple test setup, thereby reducing the effort required to identify complex characteristics.

Building on the success of the Keithley 4200-SCS parameter analyzer, the new 4200A-SCS instrument features a modern industrial design, a new graphical user interface, and various self-learning tools, such as expert training videos provided with the instrument. As a result, test setup time is reduced by up to half, and operation is much simpler and more intuitive. This convenience is particularly important for applications such as semiconductor device research, device failure analysis, and reliability testing of equipment shared by multiple users.

Mike Flaherty, General Manager of the Keithley product family at Tektronix, stated, “Parameter analysis is crucial for characterizing new semiconductor equipment and materials or testing device reliability in the pre-commercialization stage. However, because the frequency of experiments is low, it is very difficult for researchers to professionally handle parameter testing equipment.”

He added, “With this in mind, after extensive research, the 4200A-SCS was designed to be exceptionally easy to install and to allow even users without prior knowledge of parameter analyzers to easily learn how to operate it.”

In response to the demands of a market environment where measurements are becoming more diverse and the complexity of semiconductor research is increasing, Tektronix has launched the Keithley 4200A-CVIV 4-channel IV/CV switch module. Used in the 4200A-SCS mainframe, this module provides on-the-fly switching between the SMU (IV) and capacitance-voltage (CV) measurements, allowing CV measurements to be moved to other device terminals without moving the probe needle or transfer cable.

The 4200A-SCS is equipped with a new high-definition widescreen display that provides a large screen area for testing and experiment interactions. The display is combined with an entirely new graphical user interface that enables intuitive operation required by novice users while simultaneously supporting advanced features required by professionals. The new user interface is accompanied by expert videos that encapsulate the knowledge and wisdom of Keithley application engineers worldwide. These videos shorten the user's learning curve, cultivate problem-solving skills for unexpected outcomes, and build confidence in the results.

Like its replacement equipment, the 4200A-SCS is a fully integrated, modular parameter analyzer that supports the electrical characteristics of materials, semiconductor devices, and processes. Composed of a source measurement unit for IV characterization, a capacitance-voltage module for AC impedance measurement, and an ultra-high-speed pulse measurement unit capable of pulse IV, waveform capture, and transient IV measurement, the 4200A-SCS provides the key parameters required by researchers or technicians for materials research, semiconductor device design, development, or production.

The Keithley 4200A-SCS parameter analyzer and 4200A-CVIS switching module are currently available for sale and supply through Tektronix branches worldwide, and detailed inquiries regarding domestic supply prices can be made by calling the Tektronix Korea branch.