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Radiation-resistant power management device integrating comprehensive functions into an ultra-small form factor
TI (CEO Kent Tran) announced the release of the industry's first DDR (double-data-rate) memory linear regulator for space industry applications.
The new TPS7H3301-SP is the only DDR regulator with a single-event effects (SEE) tolerance of up to 65 MeV/cm2, and powers single-board computers and space satellite payloads including solid-state writers and other memory applications.
The TPS7H3301-SP, which integrates two monolithic power FETs (field-effect transistors) for source/sink termination and internal voltage reference, is up to 50% smaller than switch-mode regulator DDR solutions. TI is showcasing a live demonstration of this new regulator and an advanced radiation-resistant portfolio at the 2016 IEEE (Institute of Electrical and Electronics Engineers) and NSREC (Nuclear and Space Radiation Effects Conference) event (Booth No. 43) , which began on July 11.

Key features and advantages of the TPS7H3301-SP include a small size of 0.16 square inches, which allows it to be designed up to 50% smaller than switch-mode regulator DDR solutions, reducing critical weight and firing costs.
This device has industry-leading tolerance and can withstand a total ionizing dose (TID) of up to 100 krad, and ensures that single-event effects (SEE) do not affect read/write operations through a stable termination power supply.
In addition, developers can use the TPS7H3301-SP and TPS50601-SP buck converters together to implement the smallest and most complete power solution for DDR memory. TI's entire space industry product portfolio provides developers with a complete set of support resources, including extensive radiation reports, on-demand training, and SPICE (Simulation Program with Integrated Circuit Emphasis) models.
TI (CEO Kent Tran) announced the release of the industry's first DDR (double-data-rate) memory linear regulator for space industry applications.
The new TPS7H3301-SP is the only DDR regulator with a single-event effects (SEE) tolerance of up to 65 MeV/cm2, and powers single-board computers and space satellite payloads including solid-state writers and other memory applications.
The TPS7H3301-SP, which integrates two monolithic power FETs (field-effect transistors) for source/sink termination and internal voltage reference, is up to 50% smaller than switch-mode regulator DDR solutions. TI is showcasing a live demonstration of this new regulator and an advanced radiation-resistant portfolio at the 2016 IEEE (Institute of Electrical and Electronics Engineers) and NSREC (Nuclear and Space Radiation Effects Conference) event (Booth No. 43) , which began on July 11.
Key features and advantages of the TPS7H3301-SP include a small size of 0.16 square inches, which allows it to be designed up to 50% smaller than switch-mode regulator DDR solutions, reducing critical weight and firing costs.
This device has industry-leading tolerance and can withstand a total ionizing dose (TID) of up to 100 krad, and ensures that single-event effects (SEE) do not affect read/write operations through a stable termination power supply.
In addition, developers can use the TPS7H3301-SP and TPS50601-SP buck converters together to implement the smallest and most complete power solution for DDR memory. TI's entire space industry product portfolio provides developers with a complete set of support resources, including extensive radiation reports, on-demand training, and SPICE (Simulation Program with Integrated Circuit Emphasis) models.
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